strategy have to be incorporated into the design (e.g., scan cells or special test controllers). 10.4 Test Methods for Synthesis 10.4.1 Scan Techniques Testing sequential logic is very hard if no DFT is provided.
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Embedded systems are usually composed of several interacting components such as custom or application specific processors, ASICs, memory blocks, and the associated communication infrastructure. The development of tools to support the design of such systems requires a further step from high-level synthesis towards a higher abstraction level. The lack of
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This volume contains the proceedings of the 4th International Workshop on Field-Programmable Logic and Applications (FPL '94), held in Prague, Czech Republic in September 1994. The growing importance of field-programmable devices is substantiated by the remarkably high number of 116 submissions for FPL '94; from them, the revised versions of
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In response to tremendous growth and new technologies in the semiconductor industry, this volume is organized into five, information-rich sections. Digital Design and Fabrication surveys the latest advances in computer architecture and design as well as the technologies used to manufacture and test them. Featuring contributions from leading experts, the